• DocumentCode
    3424875
  • Title

    Modelling of process and reliability of press-fit interconnections

  • Author

    Fellner, Thomas ; Zukowski, Elena ; Wilde, Jiirgen

  • Author_Institution
    Dept. of Microsyst. Eng., Univ. of Freiburg, Freiburg
  • fYear
    2009
  • fDate
    26-29 April 2009
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    This investigation is aimed at the stability of press-fit interconnections for MID. Moulded interconnect devices (MID) are 3-dimensional substrates produced by thermoplastic injection moulding for large-series applications. The assembly process of press-fit interconnections has been correctly modelled with a FE-Software. With this model the behaviour of the mechanical contact pressure, which decreases due to creep in the thermoplastic base material, could be described. Especially, the modelling is a tool to optimize pin and hole geometries. In order to obtain realistic results, the creep law parameters for the applied base material, a liquid-crystal polymer (LCP), was fitted to experimental. The required coefficients of friction were determined by adapting the simulations to the experiments. The time-dependent retention force between a pin and the substrate directly after assembly or after temperature loads could be predicted with finite element analyses, which was used as reliability criterion.
  • Keywords
    creep; finite element analysis; friction; injection moulding; interconnections; liquid crystal polymers; mechanical contact; press fitting; reliability; 3D substrates; FE-Software; MID; assembly process; coefficients of friction; creep law parameters; finite element analyses; liquid-crystal polymer; mechanical contact pressure; moulded interconnect devices; press-fit interconnections; reliability criterion; thermoplastic base material; thermoplastic injection moulding; Assembly; Creep; Finite element methods; Friction; Geometry; Injection molding; Liquid crystal polymers; Solid modeling; Stability; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
  • Conference_Location
    Delft
  • Print_ISBN
    978-1-4244-4160-0
  • Electronic_ISBN
    978-1-4244-4161-7
  • Type

    conf

  • DOI
    10.1109/ESIME.2009.4938502
  • Filename
    4938502