DocumentCode
3425090
Title
Cohesive zone simulation on dynamic fracture at the interfaces of a single solder joint
Author
Feng Gao ; Jing, Jianping ; Liang, Frank Z. ; Williams, Richard L. ; Jianmin Qu
Author_Institution
Georgia Inst. of Technol., Atlanta, GA
fYear
2009
fDate
26-29 April 2009
Firstpage
1
Lastpage
7
Abstract
The interfacial failure behavior of a single solder joint is investigated under the pure tensile or shear loading at 5 mm/s. The brittel failure is detected for the specimen under pure tension loading, while a ductile failure is found after pure shear loading. A cohesive zone model is employed herein to explore the dynamic fracture behavior at the solder/IMC and IMC/Cu pad interfaces. The simulated results show that these two interfaces possess different mechanical properties. Under pure tensile loading at 5 mm/s, the damage typically starts at the edge of the solder/IMC interface, while the crack is eventually generated and propagated at the IMC/Cu pad interface, which corresponds to a typical brittle interfacial failure.
Keywords
brittle fracture; cracks; ductility; failure analysis; solders; stress-strain relations; surface mount technology; brittle interfacial failure; cohesive zone simulation; ductile failure; dynamic fracture; interfacial failure behavior; pure shear loading; pure tensile loading; single solder joint interfaces; Computational fluid dynamics; Heat transfer; Microelectronics; Physics; Process design; Soldering; Technology management; Thermal engineering; Thermal management; Thermomechanical processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
Conference_Location
Delft
Print_ISBN
978-1-4244-4160-0
Electronic_ISBN
978-1-4244-4161-7
Type
conf
DOI
10.1109/ESIME.2009.4938512
Filename
4938512
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