Title :
Cohesive zone simulation on dynamic fracture at the interfaces of a single solder joint
Author :
Feng Gao ; Jing, Jianping ; Liang, Frank Z. ; Williams, Richard L. ; Jianmin Qu
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA
Abstract :
The interfacial failure behavior of a single solder joint is investigated under the pure tensile or shear loading at 5 mm/s. The brittel failure is detected for the specimen under pure tension loading, while a ductile failure is found after pure shear loading. A cohesive zone model is employed herein to explore the dynamic fracture behavior at the solder/IMC and IMC/Cu pad interfaces. The simulated results show that these two interfaces possess different mechanical properties. Under pure tensile loading at 5 mm/s, the damage typically starts at the edge of the solder/IMC interface, while the crack is eventually generated and propagated at the IMC/Cu pad interface, which corresponds to a typical brittle interfacial failure.
Keywords :
brittle fracture; cracks; ductility; failure analysis; solders; stress-strain relations; surface mount technology; brittle interfacial failure; cohesive zone simulation; ductile failure; dynamic fracture; interfacial failure behavior; pure shear loading; pure tensile loading; single solder joint interfaces; Computational fluid dynamics; Heat transfer; Microelectronics; Physics; Process design; Soldering; Technology management; Thermal engineering; Thermal management; Thermomechanical processes;
Conference_Titel :
Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
Conference_Location :
Delft
Print_ISBN :
978-1-4244-4160-0
Electronic_ISBN :
978-1-4244-4161-7
DOI :
10.1109/ESIME.2009.4938512