Title :
Empirically generated metric spaces for ATR in clutter
Author :
Bitouk, D. ; Miller, M.I. ; Younes, L.
Author_Institution :
Center for Imaging Sci., Johns Hopkins Univ., Baltimore, MD, USA
Abstract :
One of the central problems in automated target recognition is to accommodate the infinite variety of clutter in real military environments. Our principle focus is to construct a metric space where the metric measures the distance between objects of interest invariant to the infinite variety of clutter. Such metrics are formulated using second-order random field models.
Keywords :
clutter; image processing; military computing; military systems; object recognition; ATR; EO imagery; automated target recognition; clutter; electro-optical images; metric spaces; military environments; objects of interest; second-order random field models; Artificial intelligence; Computational geometry; Context modeling; Extraterrestrial measurements; Image analysis; Layout; Robustness; Solid modeling; Statistics; Target recognition;
Conference_Titel :
Signals, Systems and Computers, 2002. Conference Record of the Thirty-Sixth Asilomar Conference on
Conference_Location :
Pacific Grove, CA, USA
Print_ISBN :
0-7803-7576-9
DOI :
10.1109/ACSSC.2002.1197010
