• DocumentCode
    342525
  • Title

    A multiscale method for fast capacitance extraction

  • Author

    Tausch, Johannes ; White, Jacob

  • Author_Institution
    Dept. of Math., Southern Methodist Univ., Dallas, TX, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    537
  • Lastpage
    542
  • Abstract
    The many levels of metal used in aggressive deep submicron process technologies has made fast and accurate capacitance extraction of complicated 3D geometries of conductors essential, and many novel approaches have been recently developed. In this paper we present an accelerated boundary-element method, like the well-known FASTCAP program, but instead of using an adaptive fast multipole algorithm we use a numerically generated multiscale basis for constructing a sparse representation of the dense boundary-element matrix. Results are presented to demonstrate that the multiscale method can be applied to complicated geometries, generates a sparser boundary-element matrix than the adaptive fast multipole method and provides an inexpensive but effective preconditioner. Examples are used to show that the better sparsification and the effective preconditioner yield a method that can be 25 times faster than FASTCAP while still maintain accuracy in the smallest coupling capacitances
  • Keywords
    VLSI; boundary-elements methods; capacitance; circuit CAD; integrated circuit design; sparse matrices; 3D geometries; accelerated boundary-element method; capacitance extraction; coupling capacitances; deep submicron process technologies; dense boundary-element matrix; multiscale method; numerically generated multiscale basis; preconditioner; sparse representation; sparsification; Acceleration; Capacitance; Conductors; Finite difference methods; Geometry; Integral equations; Mathematics; Permission; Postal services; Sparse matrices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1999. Proceedings. 36th
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    1-58113-092-9
  • Type

    conf

  • DOI
    10.1109/DAC.1999.781374
  • Filename
    781374