DocumentCode :
342525
Title :
A multiscale method for fast capacitance extraction
Author :
Tausch, Johannes ; White, Jacob
Author_Institution :
Dept. of Math., Southern Methodist Univ., Dallas, TX, USA
fYear :
1999
fDate :
1999
Firstpage :
537
Lastpage :
542
Abstract :
The many levels of metal used in aggressive deep submicron process technologies has made fast and accurate capacitance extraction of complicated 3D geometries of conductors essential, and many novel approaches have been recently developed. In this paper we present an accelerated boundary-element method, like the well-known FASTCAP program, but instead of using an adaptive fast multipole algorithm we use a numerically generated multiscale basis for constructing a sparse representation of the dense boundary-element matrix. Results are presented to demonstrate that the multiscale method can be applied to complicated geometries, generates a sparser boundary-element matrix than the adaptive fast multipole method and provides an inexpensive but effective preconditioner. Examples are used to show that the better sparsification and the effective preconditioner yield a method that can be 25 times faster than FASTCAP while still maintain accuracy in the smallest coupling capacitances
Keywords :
VLSI; boundary-elements methods; capacitance; circuit CAD; integrated circuit design; sparse matrices; 3D geometries; accelerated boundary-element method; capacitance extraction; coupling capacitances; deep submicron process technologies; dense boundary-element matrix; multiscale method; numerically generated multiscale basis; preconditioner; sparse representation; sparsification; Acceleration; Capacitance; Conductors; Finite difference methods; Geometry; Integral equations; Mathematics; Permission; Postal services; Sparse matrices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1999. Proceedings. 36th
Conference_Location :
New Orleans, LA
Print_ISBN :
1-58113-092-9
Type :
conf
DOI :
10.1109/DAC.1999.781374
Filename :
781374
Link To Document :
بازگشت