An adaptive digital calibration of multi-step A/D converters

Author

Zjajo, Amir ; De Gyvez, Jose Pineda

Author_Institution

Delft Univ. of Technol., Delft, Netherlands

fYear

2010

fDate

24-28 Oct. 2010

Firstpage

2456

Lastpage

2459

Abstract

A novel digital technique for efficient calibration of static errors in high-speed, high-resolution, multi-step ADCs is proposed. The parameter update within the calibration method is extended to include and correct effects of temperature and process variations. Additionally, to guide the verification process with the information obtained through monitoring process variations, expectation-maximization method is employed. The algorithm is evaluated on a prototype multi-step ADC converter with embedded dedicated sensors fabricated in standard single poly, six metal 0.09-μm CMOS.

Keywords

CMOS digital integrated circuits; analogue-digital conversion; calibration; expectation-maximisation algorithm; adaptive digital calibration; embedded dedicated sensors; expectation-maximization method; multistep A-D converters; process variations; six metal CMOS; size 0.09 mum; standard single poly CMOS; temperature variations; Calibration; Converters; Estimation; Monitoring; Temperature measurement; Temperature sensors; calibration; process variation; sensors;

fLanguage

English

Publisher

ieee

Conference_Titel

Signal Processing (ICSP), 2010 IEEE 10th International Conference on

Conference_Location

Beijing

Print_ISBN

978-1-4244-5897-4

Type

conf

DOI

10.1109/ICOSP.2010.5657033

Filename

5657033