Title :
An adaptive digital calibration of multi-step A/D converters
Author :
Zjajo, Amir ; De Gyvez, Jose Pineda
Author_Institution :
Delft Univ. of Technol., Delft, Netherlands
Abstract :
A novel digital technique for efficient calibration of static errors in high-speed, high-resolution, multi-step ADCs is proposed. The parameter update within the calibration method is extended to include and correct effects of temperature and process variations. Additionally, to guide the verification process with the information obtained through monitoring process variations, expectation-maximization method is employed. The algorithm is evaluated on a prototype multi-step ADC converter with embedded dedicated sensors fabricated in standard single poly, six metal 0.09-μm CMOS.
Keywords :
CMOS digital integrated circuits; analogue-digital conversion; calibration; expectation-maximisation algorithm; adaptive digital calibration; embedded dedicated sensors; expectation-maximization method; multistep A-D converters; process variations; six metal CMOS; size 0.09 mum; standard single poly CMOS; temperature variations; Calibration; Converters; Estimation; Monitoring; Temperature measurement; Temperature sensors; calibration; process variation; sensors;
Conference_Titel :
Signal Processing (ICSP), 2010 IEEE 10th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5897-4
DOI :
10.1109/ICOSP.2010.5657033
