• DocumentCode
    3426005
  • Title

    Metrics selection for fault-proneness prediction of software modules

  • Author

    Yunfeng, Luo ; Ben Kerong

  • Author_Institution
    Dept. of Comput. Eng., Navy Univ. of Eng., Wuhan, China
  • Volume
    2
  • fYear
    2010
  • fDate
    25-27 June 2010
  • Abstract
    It would be valuable to use metrics to identify the fault-proneness of software modules. It is important to select the most appropriate particular metric subset for fault-proneness prediction. We proposed an approach of metrics selection, which firstly utilized the correlation analysis to eliminate the high the correlation metrics and then ranked the remaining metrics based on the gray relational analysis. Three classifiers, that were logistic regression model, NaiveBayes, and J48, were utilized to empirically investigate the usefulness of selected metrics. Our results, based on a public domain NASA data set, indicate that 1) proposed method for metrics selection is effective, and 2) using 3-4 metrics gets the balanced performance for fault-proneness prediction of software modules.
  • Keywords
    correlation methods; regression analysis; software fault tolerance; software metrics; J48; NaiveBayes; correlation analysis; correlation metrics; fault-proneness prediction; gray relational analysis; logistic regression model; metrics selection; public domain NASA data set; software modules; Analysis of variance; Design engineering; Fault diagnosis; Logistics; Military computing; NASA; Performance analysis; Predictive models; Regression analysis; Software metrics; correlation analysis; fault-proneness; gray relational analysis; metrics selection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design and Applications (ICCDA), 2010 International Conference on
  • Conference_Location
    Qinhuangdao
  • Print_ISBN
    978-1-4244-7164-5
  • Electronic_ISBN
    978-1-4244-7164-5
  • Type

    conf

  • DOI
    10.1109/ICCDA.2010.5541206
  • Filename
    5541206