Title :
Metrics selection for fault-proneness prediction of software modules
Author :
Yunfeng, Luo ; Ben Kerong
Author_Institution :
Dept. of Comput. Eng., Navy Univ. of Eng., Wuhan, China
Abstract :
It would be valuable to use metrics to identify the fault-proneness of software modules. It is important to select the most appropriate particular metric subset for fault-proneness prediction. We proposed an approach of metrics selection, which firstly utilized the correlation analysis to eliminate the high the correlation metrics and then ranked the remaining metrics based on the gray relational analysis. Three classifiers, that were logistic regression model, NaiveBayes, and J48, were utilized to empirically investigate the usefulness of selected metrics. Our results, based on a public domain NASA data set, indicate that 1) proposed method for metrics selection is effective, and 2) using 3-4 metrics gets the balanced performance for fault-proneness prediction of software modules.
Keywords :
correlation methods; regression analysis; software fault tolerance; software metrics; J48; NaiveBayes; correlation analysis; correlation metrics; fault-proneness prediction; gray relational analysis; logistic regression model; metrics selection; public domain NASA data set; software modules; Analysis of variance; Design engineering; Fault diagnosis; Logistics; Military computing; NASA; Performance analysis; Predictive models; Regression analysis; Software metrics; correlation analysis; fault-proneness; gray relational analysis; metrics selection;
Conference_Titel :
Computer Design and Applications (ICCDA), 2010 International Conference on
Conference_Location :
Qinhuangdao
Print_ISBN :
978-1-4244-7164-5
Electronic_ISBN :
978-1-4244-7164-5
DOI :
10.1109/ICCDA.2010.5541206