DocumentCode :
3426439
Title :
Design of defect tolerant Wallace multiplier
Author :
Namba, Kazuteru ; Ito, Hideo
Author_Institution :
Fac. of Eng., Chiba Univ., Japan
fYear :
2005
fDate :
12-14 Dec. 2005
Abstract :
This paper proposes a design of a defect tolerant Wallace multipliers. A repair procedure for the proposed design is also shown. This paper evaluates the proposed design from the view point of the yield, area and delay time. For example, the yield of a 32 × 32 Wallace multiplier increases from 0.90 to 0.99 by applying the proposed design while the area increases by a factor of 1.89.
Keywords :
fault tolerance; integrated circuit yield; logic design; multiplying circuits; bit-slice reconfiguration redundant design; defect tolerant Wallace multiplier design; Adders; Circuit faults; Communication cables; Data processing; Delay effects; Joining processes; Logic circuits; Reconfigurable logic; Tree data structures; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Dependable Computing, 2005. Proceedings. 11th Pacific Rim International Symposium on
Print_ISBN :
0-7695-2492-3
Type :
conf
DOI :
10.1109/PRDC.2005.30
Filename :
1607529
Link To Document :
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