• DocumentCode
    3426496
  • Title

    Micro-electro-mechanical variable blaze gratings

  • Author

    Burns, D.M. ; Bright, V.M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
  • fYear
    1997
  • fDate
    26-30 Jan 1997
  • Firstpage
    55
  • Lastpage
    60
  • Abstract
    Two types of micro-electro-mechanical variable blaze gratings (VBGs) have been designed, fabricated, and tested. The gratings operate by adjusting the blaze angle of each slat so that the specular reflection of the incident light matches a particular grating diffraction order. The VBG blaze angle is adjustable with either electrostatic or thermal actuators. VBGs direct incident light in discrete directions, and are useful for steering light with beam diameters greater than 1 mm and power intensities greater than one watt. Both electrostatic and thermal VBGs were constructed from gold and polysilicon using a surface micromachining process and tested with a 20 mW continuous wave HeNe laser operating at a wavelength of 632.8 nm. Optical selectivities (the ratio of power in the selected order to power in either of the nonselected adjacent orders) were determined for both electrostatically actuated and thermally actuated VBGs. The drive voltages for both types of gratings were measured for specific blaze angles and selected diffraction orders
  • Keywords
    diffraction gratings; elemental semiconductors; gold; integrated optics; microactuators; silicon; 1 mm; 20 mW; 632.8 nm; Au-Si; HeNe; Si; blaze angle; blaze angles; continuous wave HeNe laser; direct incident light; drive voltages; electrostatic actuators; grating diffraction; microelectromechanical variable blaze gratings; optical selectivities; polysilicon; selected diffraction orders; specular reflection; surface micromachining; thermal actuators; Diffraction gratings; Electrostatic actuators; Gold; Laser beams; Micromachining; Optical reflection; Optical surface waves; Surface emitting lasers; Surface waves; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 1997. MEMS '97, Proceedings, IEEE., Tenth Annual International Workshop on
  • Conference_Location
    Nagoya
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-3744-1
  • Type

    conf

  • DOI
    10.1109/MEMSYS.1997.581765
  • Filename
    581765