Title :
Development of EM-CCD-based X-ray detector for synchrotron applications
Author :
Tutt, J.H. ; Hall, David J. ; Soman, M.R. ; Holland, Andrew D. ; Warren, A. ; Connolley, T. ; Evagora, A.M.
Author_Institution :
Centre for Electron. Imaging, Open Univ., Milton Keynes, UK
Abstract :
A high speed, low noise camera system for crystallography and X-ray imaging applications is developed and successfully demonstrated. By coupling an electron-multiplying (EM)-CCD to a 3:1 fibre-optic taper and a CsI(Tl) scintillator, it was possible to detect hard X-rays. This novel approach to hard X-ray imaging takes advantage of sub-electron equivalent readout noise performance at high pixel readout frequencies of EM-CCD detectors with the increase in the imaging area that is offered through the use of a fibre-optic taper. Compared with the industry state of the art, based on CCD camera systems, a high frame rate for a full-frame readout (50 ms) and a lower readout noise (<;1 electron root mean square) across a range of X-ray energies (6-18 keV) were achieved.
Keywords :
X-ray detection; X-ray imaging; charge-coupled devices; readout electronics; solid scintillation detectors; synchrotrons; CsI(Tl) scintillator; EM-CCD detectors; EM-CCD-based X-ray detector; X-ray energies; X-ray imaging applications; crystallography; electron root mean square; electron-multiplying-CCD camera; fibre-optic taper; full-frame readout; low noise camera system; pixel readout frequencies; readout noise; state-of-the-art; subelectron equivalent readout noise performance; synchrotron applications;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2014.0889
