• DocumentCode
    3426906
  • Title

    System identification with binary observations by stochastic approximation and active learning

  • Author

    Csáji, Balázs Csanád ; Weyer, Erik

  • fYear
    2011
  • fDate
    12-15 Dec. 2011
  • Firstpage
    3634
  • Lastpage
    3639
  • Abstract
    We investigate the problem of estimating a constant based on noisy observations via a binary sensor. This problem is well-studied for the case when the noise characteristics are known, for example, the noise is i.i.d. and we have access to its cumulative distribution function (CDF). Here, we try to reduce the assumptions on the noise to a minimum and, for example, assume only that the noise is symmetrically distributed about zero in each time step, but otherwise the CDF is unknown. We neither assume that the noise variables are independent nor that they are stationary. They may also not have densities. We do assume, however, that the threshold of the binary sensor can be controlled. Based on the setting that the threshold can be set to any value or only to some predefined ones, we suggest solutions based on stochastic approximation (SA) and active learning (AL). In the former case, we provide a strongly consistent estimator, while in the latter case we give a probably approximately correct (PAC) algorithm. Finally, we present numerical experiments to support the results.
  • Keywords
    approximation theory; identification; learning (artificial intelligence); statistical analysis; PAC algorithm; active learning; binary observation; binary sensor; cumulative distribution function; noise characteristics; noise variable; noisy observation; probably approximately correct algorithm; stochastic approximation; strongly consistent estimator; system identification; Approximation algorithms; Approximation methods; Convergence; Noise; Noise measurement; Random variables; Yttrium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control and European Control Conference (CDC-ECC), 2011 50th IEEE Conference on
  • Conference_Location
    Orlando, FL
  • ISSN
    0743-1546
  • Print_ISBN
    978-1-61284-800-6
  • Electronic_ISBN
    0743-1546
  • Type

    conf

  • DOI
    10.1109/CDC.2011.6160484
  • Filename
    6160484