• DocumentCode
    3427245
  • Title

    Application of the immune system reaction mechanism concept to sequential control

  • Author

    Ootsuki, John Takuya ; Sekiguchi, Takashi

  • Author_Institution
    Div. of Electr. & Comput. Eng., Yokohama Nat. Univ., Japan
  • Volume
    2
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1391
  • Abstract
    The paper demonstrates the application of the immune system reaction concept to sequential control by determining control sequences of sequential control plants modeled by PI*-nets, a sub-class of Petri nets with modular modeling characteristics. We propose an approach for finding control sequences based on the immune system response mechanism, where the problem is formulated as a firing sequence problem. The original problem is divided into several smaller sub-problems, the model itself is divided into several sub-models and local firing sequences that will compose the original model firing sequence are selected by interacting common transitions of these sub-models through local objective functions. Local objective functions are set dynamically by internal and inter sub-problem interactions based on the immune system response regulatory model. Simulations demonstrated the validity and promising performance of the proposed approach
  • Keywords
    Petri nets; discrete event systems; modelling; PI*-nets; Petri nets; control sequences; firing sequence problem; immune system reaction concept; immune system reaction mechanism concept; immune system response regulatory model; inter sub-problem interactions; interacting common transitions; local firing sequences; local objective functions; modular modeling; sequential control plants; sub-models; Actuators; Application software; Control systems; Discrete event systems; Failure analysis; Immune system; Mathematical model; Petri nets; Size control; Valves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Technologies and Factory Automation, 1999. Proceedings. ETFA '99. 1999 7th IEEE International Conference on
  • Conference_Location
    Barcelona
  • Print_ISBN
    0-7803-5670-5
  • Type

    conf

  • DOI
    10.1109/ETFA.1999.813152
  • Filename
    813152