• DocumentCode
    3427255
  • Title

    Development of sheet type thermal conductive compound using AlN

  • Author

    Sasaski, Tomiya ; Hisano, Katsumi ; Sakamoto, T. ; Monma, Shun ; Fijimori, Yoshitune ; Iwasaki, Hideo ; Ishizuka, Masaru

  • Author_Institution
    Res. & Dev. Center, Toshiba Corp., Kawasaki, Japan
  • fYear
    1995
  • fDate
    4-6 Dec 1995
  • Firstpage
    236
  • Lastpage
    239
  • Abstract
    The conventional sheet type thermal conductive compound is processed by uniformly mixing high thermal conductivity materials into the organic resin. However, it is difficult to raise the sheet thermal conductivity using this compound, due to the fact that the organic resin lies between materials of high thermal conductivity. In order to solve the above-mentioned problem, the authors developed a new type of thermal sheet having thermal conductivity above 20 W/m.k, as measured with a steady state thermal conductivity meter. The proposed sheet type thermal conductive compound was formed by penetrating finely processed aluminum nitride ceramic, which was arranged uniformly, on both sides of the organic resin sheet (thermal hardening silicone). The thermal sheet formed in this way has high thermal conductivity, good electrical insulation property, and flexibility
  • Keywords
    aluminium compounds; ceramics; thermal conductivity; AlN; aluminum nitride ceramic; electrical insulation; flexibility; material processing; organic resin; thermal conductive compound; thermal conductivity; thermal hardening silicone; thermal sheet; Aluminum nitride; Ceramics; Conducting materials; Conductivity measurement; Dielectrics and electrical insulation; Organic materials; Resins; Sheet materials; Steady-state; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1995, Proceedings of 1995 Japan International, 18th IEEE/CPMT International
  • Conference_Location
    Omiya
  • Print_ISBN
    0-7803-3622-4
  • Type

    conf

  • DOI
    10.1109/IEMT.1995.541034
  • Filename
    541034