DocumentCode :
3427999
Title :
Efficient transient simulation of failure/repair Markovian models
Author :
Carrasco, Juan A.
Author_Institution :
Dept. d´´Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona, Spain
fYear :
1991
fDate :
30 Sep-2 Oct 1991
Firstpage :
152
Lastpage :
161
Abstract :
Simulation methods for the solution of the extremely large Markovian dependability models which result from complex fault-tolerant computer systems have recently been developed. The author presents efficient simulation methods for the estimation of transient reliability/availability metrics for repairable fault-tolerant computer systems which combine estimator decomposition techniques with an efficient importance sampling technique. Comparison with simulation methods previously proposed for the same type of metrics and models shows that the proposed methods are orders of magnitude faster
Keywords :
Markov processes; fault tolerant computing; availability metrics; complex fault-tolerant computer systems; estimator decomposition; failure/repair Markovian models; importance sampling technique; transient reliability; transient simulation; Availability; Computational modeling; Computer simulation; Context modeling; Fault tolerant systems; Monte Carlo methods; Sampling methods; State-space methods; Steady-state;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliable Distributed Systems, 1991. Proceedings., Tenth Symposium on
Conference_Location :
Pisa
Print_ISBN :
0-8186-2260-1
Type :
conf
DOI :
10.1109/RELDIS.1991.145417
Filename :
145417
Link To Document :
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