Title :
Microvalve with ultra-low leakage
Author :
Hirano, Motohisa ; Yanagisawa, Keiichi ; Kuwano, Hiroki ; Nakano, Satoko
Author_Institution :
NTT Integrated Inf. & Energy Syst. Labs., Tokyo, Japan
Abstract :
This paper reports a reduction of microvalve leakage based on precise measurements of leak and flow rates. The tight contact between a valve cap and seat, which is obtained by nanometer-scale flat surfaces and by self-alignment of the cap and seat-bore, makes the leakage from a microvalve ultra-low. The leak and flow rates are determined by precisely measuring pressure changes when introducing helium gas into a flow line. We have, consequently, attained a leak rate as low as 5.8×10-10 Pa.m3/s and a flow rate ranging from 4.0×10-6 to 3.2×10-4 Pa.m3 /s
Keywords :
flow control; flow measurement; leak detection; microactuators; surface topography; valves; He gas introduction; Si; SiN seat; SiN-Si-SiO2; flow rate measurement; fluid flow control; leak rate measurement; microvalve leakage reduction; nanometer-scale flat surfaces; precise measurements; pressure changes; surface topography; valve cap seat contact; valve conductance; Argon; Etching; Fabrication; Fluid flow; Magnetic levitation; Microvalves; Silicon; Springs; Substrates; Valves;
Conference_Titel :
Micro Electro Mechanical Systems, 1997. MEMS '97, Proceedings, IEEE., Tenth Annual International Workshop on
Conference_Location :
Nagoya
Print_ISBN :
0-7803-3744-1
DOI :
10.1109/MEMSYS.1997.581844