DocumentCode :
3428243
Title :
High-accuracy frequency standards using laser-cooled Hg/sup +/ ions
Author :
Berkeland, D.J. ; Miller, Jason D. ; Bergquist, J.C. ; Itano, KM ; Wineland, D.J.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear :
1998
fDate :
29-29 May 1998
Firstpage :
32
Lastpage :
36
Abstract :
We discuss frequency standards based on laser-cooled /sup 199/Hg/sup +/ ions confined in cryogenic rf (Paul) traps. In one experiment, the frequency of a microwave source is servoed to the ions´ ground-state hyperfine transition at 40.5 GHz. For seven ions and a Ramsey free precession time of 100 s, the fractional frequency stability is 3.3 (2)/spl times/10/sup -13/ /spl tau//sup -1/2/ for measurement times /spl tau/<2 h. The ground-state hyperfine interval is measured to be 40 507 347 996.841 59 (14) (41) Hz, where the first number in parentheses is the uncertainty due to statistics and systematic errors, and the second is the uncertainty in the frequency of the international time scale to which the standard is compared. In a second experiment under development, a strong-binding cryogenic trap will confine a single ion for use in an optical frequency standard based on a narrow electric quadrupole transition at 282 nm.
Keywords :
frequency stability; frequency standards; hyperfine interactions; laser cooling; mercury (metal); particle traps; /sup 199/Hg/sup +/ ions; 2 h; 282 nm; 40.5 GHz; 40507347996.849 Hz; Hg; Paul traps; Ramsey free precession time; cryogenic rf traps; electric quadrupole transition; fractional frequency stability; frequency standards; ground-state hyperfine interval; ground-state hyperfine transition; international time scale; laser-cooled ions; measurement times; microwave source; optical frequency standard; statistics errors; strong-binding cryogenic trap; systematic errors; uncertainty; Charge carrier processes; Cryogenics; Error analysis; Frequency measurement; Laser transitions; Masers; Measurement standards; Mercury (metals); Stability; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1998. Proceedings of the 1998 IEEE International
Conference_Location :
Pasadena, CA, USA
ISSN :
1075-6787
Print_ISBN :
0-7803-4373-5
Type :
conf
DOI :
10.1109/FREQ.1998.717875
Filename :
717875
Link To Document :
بازگشت