Title :
Model structure learning: A support vector machine approach for LPV linear-regression models
Author :
Tóth, Roland ; Laurain, Vincent ; Zheng, Wei Xing ; Poolla, Kameshwar
Author_Institution :
Delft Center for Syst. & Control, Delft Univ. of Technol., Delft, Netherlands
Abstract :
Accurate parametric identification of Linear Parameter-Varying (LPV) systems requires an optimal prior selection of a set of functional dependencies for the parametrization of the model coefficients. Inaccurate selection leads to structural bias while over-parametrization results in a variance increase of the estimates. This corresponds to the classical bias-variance trade-off, but with a significantly larger degree of freedom and sensitivity in the LPV case. Hence, it is attractive to estimate the underlying model structure of LPV systems based on measured data, i.e., to learn the underlying dependencies of the model coefficients together with model orders etc. In this paper a Least-Squares Support Vector Machine (LS-SVM) approach is introduced which is capable of reconstructing the dependency structure for linear regression based LPV models even in case of rational dynamic dependency. The properties of the approach are analyzed in the prediction error setting and its performance is evaluated on representative examples.
Keywords :
learning (artificial intelligence); least squares approximations; linear systems; parameter estimation; performance evaluation; reduced order systems; regression analysis; sensitivity analysis; support vector machines; LPV linear-regression models; LPV models; LPV systems; LS-SVM approach; bias-variance trade-off; degree of freedom; dependency structure; functional dependency; least-squares support vector machine approach; linear parameter-varying systems; linear regression; measured data; model coefficients; model orders; model structure learning; optimal prior selection; over-parametrization; parametric identification; performance evaluation; rational dynamic dependency; representative examples; sensitivity; structural bias; underlying model structure; Computational modeling; Data models; Dispersion; Estimation; Kernel; Noise; Support vector machines; ARX; Linear parameter-varying; identification; linear regression; model structure selection; support vector machines;
Conference_Titel :
Decision and Control and European Control Conference (CDC-ECC), 2011 50th IEEE Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-61284-800-6
Electronic_ISBN :
0743-1546
DOI :
10.1109/CDC.2011.6160564