• DocumentCode
    3428759
  • Title

    Discovery of the tri-edge inequality with binary vector dissimilarity measures

  • Author

    Zhang, Bin ; Srihari, Sargur

  • Author_Institution
    Dept. of Human Genetics, California Univ., Los Angeles, CA, USA
  • Volume
    4
  • fYear
    2004
  • fDate
    23-26 Aug. 2004
  • Firstpage
    669
  • Abstract
    In certain spaces using some distance measures, the sum of any two distances is always bigger than the third one. Such a special property is called the tri-edge inequality (TEI). In this paper, the tri-edge inequality characterizing several binary distance measures is mathematically proven and experimentally verified, and the implications of TEI are discussed as well.
  • Keywords
    signal processing; vectors; binary vector dissimilarity measures; tri-edge inequality; Pattern recognition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2004. ICPR 2004. Proceedings of the 17th International Conference on
  • ISSN
    1051-4651
  • Print_ISBN
    0-7695-2128-2
  • Type

    conf

  • DOI
    10.1109/ICPR.2004.1333861
  • Filename
    1333861
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3428759