DocumentCode :
3428775
Title :
A sixteen level scheme enabling 64 Mbit flash memory using 16 Mbit technology
Author :
Kencke, D.L. ; Richart, R. ; Garg, S. ; Banerjee, S.K.
Author_Institution :
Microelectron. Res. Center, Texas Univ., Austin, TX, USA
fYear :
1996
fDate :
8-11 Dec. 1996
Firstpage :
937
Lastpage :
939
Abstract :
Multilevel flash memories have been shown to double storage capacity without changing device dimensions. In this work, it is demonstrated for the first time that sixteen levels can be stored within a small 2.5 V spread, quadrupling memory size with four bits/cell. A new method is used to calculate programmed threshold voltages, V/sub t/´s, showing that transistor V/sub t/´s may overlap while logical V/sub t/´s remain distinct. A ten-year equivalent data retention bake demonstrates the feasibility of this approach for producing 64 Mbit storage capacity using existing 16 Mbit NOR stacked-gate technology.
Keywords :
EPROM; integrated memory circuits; 64 Mbit; NOR stacked-gate technology; data retention bake; multilevel flash memory; storage capacity; threshold voltage; Automatic programming; Automatic testing; Charge measurement; Current measurement; EPROM; Flash memory; Microelectronics; Solid state circuits; Threshold voltage; Transconductance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1996. IEDM '96., International
Conference_Location :
San Francisco, CA, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-3393-4
Type :
conf
DOI :
10.1109/IEDM.1996.554134
Filename :
554134
Link To Document :
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