• DocumentCode
    3429137
  • Title

    Diode laser linewidth and phase noise to intensity noise conversion in the gas-cell atomic clock

  • Author

    Coffer, J.G. ; Camparo, J.C.

  • Author_Institution
    Aerosp. Corp., El Segundo, CA, USA
  • fYear
    1998
  • fDate
    27-29 May 1998
  • Firstpage
    52
  • Lastpage
    56
  • Abstract
    In order to clarify the mechanism of increased laser relative intensity noise (RIN) in the diode laser pumped gas-cell atomic clock, we have performed experiments examining the influence of laser linewidth, ΔvL, on RIN. Our measurements are consistent with the phase noise (PM) to intensity noise (AM) conversion theory: laser phase fluctuations induce fluctuations in the absorption cross section of the atomic vapor and these yield fluctuations in the transmitted intensity of the laser. In the experiments, transmitted RIN of a beam from a 100 kHz linewidth diode laser was compared with that from a 60 MHz linewidth diode laser after each was passed through a cell containing natural rubidium vapor. We present some results of computational theory showing that for laser linewidths less than the atomic dephasing rate of the atomic vapor, RIN is proportional to √(ΔvL); however, for laser linewidths greater than the atomic dephasing rate RIN is a decreasing function of Δv L
  • Keywords
    atomic clocks; laser noise; laser stability; measurement by laser beam; optical pumping; rubidium; semiconductor lasers; Rb; absorption cross section; atomic dephasing rate; atomic vapor; diode laser linewidth; gas-cell atomic clock; intensity noise conversion; laser phase fluctuations; laser relative intensity noise; phase noise; Atom lasers; Atomic beams; Atomic measurements; Diode lasers; Fluctuations; Gas lasers; Laser noise; Laser theory; Phase noise; Pump lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1998. Proceedings of the 1998 IEEE International
  • Conference_Location
    Pasadena, CA
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-4373-5
  • Type

    conf

  • DOI
    10.1109/FREQ.1998.717879
  • Filename
    717879