Title :
Harmonic analysis based modeling of tapping-mode AFM
Author :
Sebastian, A. ; Salapaka, Murti V. ; Chen, D.J. ; Cleveland, J.P.
Author_Institution :
Dept. of Electr. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
In this paper we use harmonic balance and averaging techniques to analyze the tapping mode dynamics of the atomic force microscope (AFM). A model for the cantilever sample interaction is developed. Experimental results show that the analysis and the model predict the behavior of the tapping cantilever
Keywords :
atomic force microscopy; dynamics; harmonic analysis; position control; atomic force microscope; cantilever sample interaction; dynamics; harmonic averaging; harmonic balance; position control; tapping-mode; Atomic force microscopy; Biochemical analysis; Biological system modeling; Equations; Harmonic analysis; Image analysis; Image resolution; Instruments; Predictive models; Resonant frequency;
Conference_Titel :
American Control Conference, 1999. Proceedings of the 1999
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-4990-3
DOI :
10.1109/ACC.1999.782775
