• DocumentCode
    3429335
  • Title

    High-aspect-ratio, ultrathick, negative-tone near-uv photoresist for MEMS applications

  • Author

    Despont, M. ; Lorenz, H. ; Fahrni, N. ; Brugger, J. ; Renaud, P. ; Vettiger, P.

  • Author_Institution
    Zurich Res. Lab., IBM Res. Div., Ruschlikon, Switzerland
  • fYear
    1997
  • fDate
    26-30 Jan 1997
  • Firstpage
    518
  • Lastpage
    522
  • Abstract
    Detailed investigations of the limits of a new negative-tone near-UV resist (IBM SU-8) have been performed. SU-8 is an epoxy-based resist designed specifically for ultrathick, high-aspect-ratio MEMS-type applications. We have demonstrated that with single-layer coatings, thicknesses of more than 500 μm can be achieved reproducibly. Thicker resist layers can be made by multiple coatings, and we have achieved exposures in 1200-μm-thick, double coated SU-8 resist layers. We have found that the aspect ratio for near-UV (400 nm) exposed and developed structures can be greater than 18 and remains constant in the thickness range between 80 and 1200 μm. Vertical sidewall profiles result in good dimensional control over the entire resist thickness. To our knowledge, this is the highest aspect ratio reported for near-UV exposures and resist thicknesses. These results will open up new possibilities for low-cost LIGA-type processes for MEMS applications. In addition, the SU-8 material has interesting mechanical properties which also makes it attractive for photoplastic device fabrication
  • Keywords
    micromechanical devices; photoresists; 400 nm; 80 to 1200 mum; LIGA; MEMS; SU-8; Si; dimensional control; epoxy-based resist; multiple coatings; near-UV exposures; negative-tone near-UV resist; photoplastic device fabrication; resist thicknesses; single-layer coatings; vertical sidewall profiles; Coatings; Costs; EPON; Fabrication; Micromechanical devices; Optical scattering; Resins; Resists; Thickness control; X-ray lithography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 1997. MEMS '97, Proceedings, IEEE., Tenth Annual International Workshop on
  • Conference_Location
    Nagoya
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-3744-1
  • Type

    conf

  • DOI
    10.1109/MEMSYS.1997.581916
  • Filename
    581916