DocumentCode
3429454
Title
1-D inverse problem solution for multilayered dielectric structure using K-signal conception
Author
Drobakhin, Oleg ; Saltykov, Dmitriy
Author_Institution
Dnepropetrovsk State Univ., Ukraine
fYear
1996
fDate
10-13 Sep 1996
Firstpage
432
Lastpage
435
Abstract
1D inverse problem for multilayered dielectric structures is induced by different applications. The constancy of every layer parameters is given. This situation corresponds to the partial-constant profile of permittivity. The problem is to estimate values of dielectric constants and thickness of every layer simultaneously with only one-side access, thus only reflection coefficient (RC) information can be used
Keywords
dielectric materials; electromagnetic wave reflection; inverse problems; least squares approximations; permittivity; 1D inverse problem; 1D inverse problem solution; EM wave reflection; K-signal conception; dielectric constants; every layer parameters; multilayered dielectric structure; multilayered dielectric structures; one-side access; partial-constant profile; permittivity; reflection coefficient; Dielectric constant; Frequency measurement; Inverse problems; Parameter estimation; Permittivity; Poles and zeros; Reflection; State estimation; Testing; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Mathematical Methods in Electromagnetic Theory, 1996., 6th International Conference on
Conference_Location
Lviv
Print_ISBN
0-7803-3291-1
Type
conf
DOI
10.1109/MMET.1996.565752
Filename
565752
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