• DocumentCode
    3429679
  • Title

    Subband noise estimation for adaptive wavelet shrinkage

  • Author

    Yuan, Xiaohui ; Buckles, Bill P.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Tulane Univ., New Orleans, LA, USA
  • Volume
    4
  • fYear
    2004
  • fDate
    23-26 Aug. 2004
  • Firstpage
    885
  • Abstract
    In this article, we present an adaptive image denoising method based on subband noise modeling. For wavelet shrinkage, choosing the threshold depends on correctly estimating the noise variance. By modeling the inter-subband noise variance with a parameterized normalized exponential function, the problem becomes identifying the maximum noise variance. Such a maximum exists in the highest decomposition level and can be estimated by locating the extreme of the first derivative of the subband variance function. The experiments demonstrate that our method outperforms peers, especially in the cases of large noise variance.
  • Keywords
    image denoising; wavelet transforms; adaptive image denoising method; adaptive wavelet shrinkage; noise variance; parameterized normalized exponential function; subband noise estimation; subband variance function; Bayesian methods; Gaussian distribution; Gaussian noise; Histograms; Image denoising; Image fusion; Image processing; Noise figure; Noise level; Wavelet domain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2004. ICPR 2004. Proceedings of the 17th International Conference on
  • ISSN
    1051-4651
  • Print_ISBN
    0-7695-2128-2
  • Type

    conf

  • DOI
    10.1109/ICPR.2004.1333914
  • Filename
    1333914