Title :
System-level DFT for consumer products
fDate :
May 29 2001-June 1 2001
Keywords :
Assembly; Consumer products; Costs; Digital TV; Nails; Packaging; Pins; Silicon; System testing; Video recording;
Conference_Titel :
Test Workshop, 2001. IEEE European
Conference_Location :
Stockholm, Sweden
Print_ISBN :
0-7695-1017-5
DOI :
10.1109/ETW.2001.946656
