Title :
Demodulation based testing of off-chip driver performance
Author_Institution :
Hochschule Magdeburg-Stendahl
Keywords :
Automatic testing; Circuit testing; Costs; Delay effects; Demodulation; Integrated circuit testing; Signal analysis; Signal generators; Time measurement; Timing;
Conference_Titel :
Test Workshop, 2001. IEEE European
Print_ISBN :
0-7695-1017-5
DOI :
10.1109/ETW.2001.946660
