DocumentCode

3430728

Title

On-chip signal level evaluation for mixed-signal ICs using digital window comparators

Author

De Venuto, D. ; Ohletz, M.J. ; Ricco, B.

Author_Institution

Politecnico di Bari

fYear

2001

fDate

2001

Firstpage

68

Lastpage

72

Keywords

CMOS logic circuits; CMOS technology; Circuit testing; Costs; Inverters; Logic design; Logic gates; Logic testing; Software libraries; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Workshop, 2001. IEEE European

ISSN

1530-1877

Print_ISBN

0-7695-1017-5

Type

conf

DOI

10.1109/ETW.2001.946664

Filename

946664