Title :
On-chip signal level evaluation for mixed-signal ICs using digital window comparators
Author :
De Venuto, D. ; Ohletz, M.J. ; Ricco, B.
Author_Institution :
Politecnico di Bari
Keywords :
CMOS logic circuits; CMOS technology; Circuit testing; Costs; Inverters; Logic design; Logic gates; Logic testing; Software libraries; Threshold voltage;
Conference_Titel :
Test Workshop, 2001. IEEE European
Print_ISBN :
0-7695-1017-5
DOI :
10.1109/ETW.2001.946664
