DocumentCode :
3430864
Title :
On hardware generation of random single input change test sequences
Author :
David, R. ; Girard, P. ; Landrault, C. ; Pravossoudovitch, S. ; Virazel, A.
Author_Institution :
(INPG- CNRS- UJF)
fYear :
2001
fDate :
2001
Firstpage :
117
Lastpage :
123
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Delay effects; Hardware; Microwave integrated circuits; Robustness; Silicon carbide; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Workshop, 2001. IEEE European
ISSN :
1530-1877
Print_ISBN :
0-7695-1017-5
Type :
conf
DOI :
10.1109/ETW.2001.946674
Filename :
946674
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3430864
