DocumentCode

3430889

Title

Rxiensing scan chains for test pattern decompression

Author

Dorsch, Rainer ; Wunderlich, Hans-Joachim

Author_Institution

University of Stuttgart

fYear

2001

fDate

2001

Firstpage

124

Lastpage

132

Keywords

Automatic testing; Bandwidth; Built-in self-test; Costs; Hardware; Hybrid power systems; Logic; System testing; System-on-a-chip; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Workshop, 2001. IEEE European

ISSN

1530-1877

Print_ISBN

0-7695-1017-5

Type

conf

DOI

10.1109/ETW.2001.946677

Filename

946677