Title :
Rxiensing scan chains for test pattern decompression
Author :
Dorsch, Rainer ; Wunderlich, Hans-Joachim
Author_Institution :
University of Stuttgart
Keywords :
Automatic testing; Bandwidth; Built-in self-test; Costs; Hardware; Hybrid power systems; Logic; System testing; System-on-a-chip; Test pattern generators;
Conference_Titel :
Test Workshop, 2001. IEEE European
Print_ISBN :
0-7695-1017-5
DOI :
10.1109/ETW.2001.946677
