DocumentCode :
3430901
Title :
A VHDL-based virtual test concept for pre-silicon test-program debug
Author :
Rona, Marco ; Krampl, Gunter
Author_Institution :
Infineon Technologies
fYear :
2001
fDate :
2001
Firstpage :
135
Lastpage :
139
Keywords :
Concurrent engineering; Debugging; Hardware design languages; Integrated circuit modeling; Particle measurements; Phase measurement; Sequential analysis; Silicon; Software testing; Time to market;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Workshop, 2001. IEEE European
ISSN :
1530-1877
Print_ISBN :
0-7695-1017-5
Type :
conf
DOI :
10.1109/ETW.2001.946679
Filename :
946679
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3430901
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