Title :
20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems - Title
Abstract :
The following topics are dealt with: VLSI design; formal verification; scheduling for embedded processors; architecture and design; RF circuits; technology modeling and simulation; compilation techniques for embedded processors; signal integrity and timing analysis; digital circuits; SoC test and verification; dynamic and runtime reconfigurable systems; synthesis and system level design; test generation and high level test; low power electronics; system level modeling, estimation and exploration; power analysis and optimization; memory design; emerging technology; architecture enhancements for embedded processors; process variation and reliability; hardware architectures; analog test, delay test, and test power; application-specific custom architectures; physical design and modeling; and analog techniques
Keywords :
VLSI; analogue integrated circuits; automatic test pattern generation; circuit simulation; digital integrated circuits; embedded systems; formal verification; integrated circuit design; integrated circuit modelling; integrated circuit testing; integrated memory circuits; low-power electronics; radiofrequency integrated circuits; scheduling; system-on-chip; RF circuits; SoC test; VLSI design; analog techniques; analog test; application-specific custom architectures; compilation techniques; delay test; digital circuits; dynamic reconfigurable systems; embedded processors; formal verification; hardware architectures; high level test; low power electronics; memory design; optimization; physical design and modeling; power analysis; runtime reconfigurable systems; scheduling; signal integrity; simulation; system level design; system level modeling; technology modeling; test generation; test power; timing analysis;
Conference_Titel :
VLSI Design, 2007. Held jointly with 6th International Conference on Embedded Systems., 20th International Conference on
Conference_Location :
Bangalore
Print_ISBN :
0-7695-2762-0
DOI :
10.1109/VLSID.2007.4
