Title :
Efficient Microprocessor Verification using Antecedent Conditioned Slicing
Author :
Vasudevan, Shobha ; Viswanath, Vinod ; Abraham, Jacob A.
Author_Institution :
Comput. Eng. Res. Center, Texas at Austin Univ., TX
Abstract :
The authors present a technique for automatic verification of pipelined microprocessors using model checking. Antecedent conditioned slicing is an efficient abstraction technique for hardware designs at the register transfer level (RTL). Antecedent conditioned slicing prunes the verification state space, using information from the antecedent of a given LTL property. In this work, the authors model instructions of a pipelined processor as LTL properties, such that the instruction opcode forms the antecedent. The antecedent conditioned slicing to decompose the problem space of pipelined processor verification on an instruction-wise basis was used. We pass the resulting smaller, tractable problems through a lower level verification engine. We thereby verify that every instruction behaves according to the specification and ensure that non-target registers are not modified by the instruction. The SMV model checker to verify all the instruction classes of a Verilog RTL implementation of the OR1200, an off-the-shelf pipelined processor was used
Keywords :
formal verification; hardware description languages; logic design; microprocessor chips; pipeline processing; LTL properties; SMV model checker; Verilog RTL implementation; abstraction technique; antecedent conditioned slicing; automatic verification; microprocessor verification; model checking; pipelined microprocessors; pipelined processor verification; register transfer level; verification state space; Binary decision diagrams; Engines; Formal verification; Hardware design languages; Jacobian matrices; Microprocessors; Process design; Registers; State-space methods; Testing;
Conference_Titel :
VLSI Design, 2007. Held jointly with 6th International Conference on Embedded Systems., 20th International Conference on
Conference_Location :
Bangalore
Print_ISBN :
0-7695-2762-0
DOI :
10.1109/VLSID.2007.70