DocumentCode
3431774
Title
Synthesizing "Verification Aware" Models: Why and How?
Author
Ganai, Malay K. ; Mukaiyama, Akira ; Gupta, Aarti ; Wakabayshi, Kazutoshi
Author_Institution
NEC Labs. America, Princeton, NJ
fYear
2007
fDate
6-10 Jan. 2007
Firstpage
50
Lastpage
56
Abstract
Design-for-verification (DFV) methodology i.e., exporting designer\´s intent to verification tools has been quite effective in improving verification efforts. The authors take one step further in improving the verification efforts, by separating the design optimized for performance, area and power from the design optimized for correctness, thereby reducing the verification burden. The authors propose a new paradigm synthesis-for-verification (SFV) which involves synthesizing "verification-aware" designs that are more suitable for functional verification. SFV methodology should be applied along with DFV methodology to obtain the full benefit of verification efforts. Note, this SFV paradigm requires support only from automated synthesis approaches, e.g. high level synthesis (HLS), and can be easily automated. This is in contrast to DFV methodology, which requires designers\´ reliable insights. As part of SFV methodology, the authors first identify the effect of various design entities on the performance of model checkers. By guiding the use of such entities in existing behavioral synthesis techniques, the authors propose to obtain "verification friendly" models that are relatively easier to model check. The authors demonstrate effectiveness of such a paradigm using existing industry tools and designs
Keywords
formal verification; high level synthesis; integrated circuit modelling; automated synthesis approaches; behavioral synthesis techniques; design-for-verification methodology; high level synthesis; synthesis-for-verification; verification aware models; verification friendly models; verification-aware designs; Bridges; Computer bugs; Design methodology; Design optimization; High level synthesis; Laboratories; National electric code; Power system modeling; Process design; Scalability;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2007. Held jointly with 6th International Conference on Embedded Systems., 20th International Conference on
Conference_Location
Bangalore
ISSN
1063-9667
Print_ISBN
0-7695-2762-0
Type
conf
DOI
10.1109/VLSID.2007.151
Filename
4092022
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