Title :
Wafer bonding and smartcut for formation of silicon-on-insulator materials
Author :
Bengtsson, Stefan
Author_Institution :
Solid State Electron. Lab., Chalmers Univ. of Technol., Goteborg, Sweden
Abstract :
Silicon-on-insulator (SOI) materials are expected to get increased attention for mainstream CMOS as well as for high frequency or high voltage applications. Of the existing methods for manufacture of SOI materials, wafer bonding combined with smartcut seems to be the most promising approach. In the case of wafer bonding, surface micro-roughness, wafer dimensions, surface chemistry and ambient pressure all influence the result. In the smartcut technology, hydrogen implantation and an annealing step can be controlled for a precise splitting of a silicon wafer, thereby forming a thin silicon film. In this presentation the application of wafer bonding and smartcut for formation of SOI materials is reviewed
Keywords :
annealing; ion implantation; reviews; silicon-on-insulator; surface chemistry; surface topography; wafer bonding; CMOS applications; SOI; Si-SiO2; ambient pressure; annealing step; high frequency applications; high voltage applications; hydrogen implantation; review; silicon-on-insulator materials; smartcut; surface chemistry; surface micro-roughness; wafer bonding; wafer dimensions; Annealing; Chemical technology; Chemistry; Frequency; Hydrogen; Manufacturing; Semiconductor films; Silicon on insulator technology; Voltage; Wafer bonding;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4306-9
DOI :
10.1109/ICSICT.1998.786103