DocumentCode
3431938
Title
Using statistical median to check sensitivity of defect inspection
Author
Huang, Henry
Author_Institution
United Microelectron. Corp., Hsin-Chu, Taiwan
fYear
2002
fDate
10-11 Dec. 2002
Firstpage
181
Lastpage
182
Abstract
One key challenge in defect inspection module is setting up good inspection recipes and maintaining them. A good inspection recipe is defined as one which is robust in alignment and detecting most major defects with no or minimum false alarms. This challenge is even more apparent in a foundry business, due to its wide variety of products in production.
Keywords
failure analysis; inspection; semiconductor device manufacture; statistical analysis; defect inspection; false alarm; foundry business; major defects; mass production; statistical median; wafer fabs; Biographies; Cities and towns; Foundries; Humans; Inspection; Mass production; Microelectronics; Robustness; Sorting; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing Technology Workshop, 2002
Print_ISBN
0-7803-7604-8
Type
conf
DOI
10.1109/SMTW.2002.1197404
Filename
1197404
Link To Document