• DocumentCode
    3431938
  • Title

    Using statistical median to check sensitivity of defect inspection

  • Author

    Huang, Henry

  • Author_Institution
    United Microelectron. Corp., Hsin-Chu, Taiwan
  • fYear
    2002
  • fDate
    10-11 Dec. 2002
  • Firstpage
    181
  • Lastpage
    182
  • Abstract
    One key challenge in defect inspection module is setting up good inspection recipes and maintaining them. A good inspection recipe is defined as one which is robust in alignment and detecting most major defects with no or minimum false alarms. This challenge is even more apparent in a foundry business, due to its wide variety of products in production.
  • Keywords
    failure analysis; inspection; semiconductor device manufacture; statistical analysis; defect inspection; false alarm; foundry business; major defects; mass production; statistical median; wafer fabs; Biographies; Cities and towns; Foundries; Humans; Inspection; Mass production; Microelectronics; Robustness; Sorting; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Technology Workshop, 2002
  • Print_ISBN
    0-7803-7604-8
  • Type

    conf

  • DOI
    10.1109/SMTW.2002.1197404
  • Filename
    1197404