Title :
Using statistical median to check sensitivity of defect inspection
Author_Institution :
United Microelectron. Corp., Hsin-Chu, Taiwan
Abstract :
One key challenge in defect inspection module is setting up good inspection recipes and maintaining them. A good inspection recipe is defined as one which is robust in alignment and detecting most major defects with no or minimum false alarms. This challenge is even more apparent in a foundry business, due to its wide variety of products in production.
Keywords :
failure analysis; inspection; semiconductor device manufacture; statistical analysis; defect inspection; false alarm; foundry business; major defects; mass production; statistical median; wafer fabs; Biographies; Cities and towns; Foundries; Humans; Inspection; Mass production; Microelectronics; Robustness; Sorting; Throughput;
Conference_Titel :
Semiconductor Manufacturing Technology Workshop, 2002
Print_ISBN :
0-7803-7604-8
DOI :
10.1109/SMTW.2002.1197404