• DocumentCode
    3432067
  • Title

    A theory for anomalous spectral behaviors observed in proton-enhanced microstrip inductors on silicon with its brief derivation

  • Author

    Liao, Chungpin ; Liu, Chih-Wei ; Hsu, Yu-Min ; Duh, Ting-Shien

  • Author_Institution
    Adv. Res. & Bus. Lab., Taichung, Taiwan
  • fYear
    2002
  • fDate
    10-11 Dec. 2002
  • Firstpage
    195
  • Lastpage
    203
  • Abstract
    The verified applicability of proton-beam treatment (the so-called, "π technology") in both the device isolation and inductor Q-improvement on Si substrates is now enticing some big chipmakers into realizing a VLSI back-end facility: the particle-beam stand (PBS). Potentially, the PBS can end the traditionally laborious mixed-mode product development cycle and eventually become the general SOC integration platform. Recently, however, there are several questions encountered in the proton-enhanced inductors. Among others, there are explosive rise of the inductance near certain frequency in some cases but not in others, and the inductor size effect that dubiously alters the frequency at which the above anomaly takes place. Such difficulties seem to go beyond the current understanding of the microstrip inductors. A new theory is briefly presented here to address the possible cause of such puzzles.
  • Keywords
    elemental semiconductors; inductance; inductors; isolation technology; microstrip components; proton effects; silicon; substrates; system-on-chip; SOC integration platform; Si; Si substrates; VLSI back-end facility; anomalous spectral properties; device isolation; inductor Q-improvement; inductor size effect; laborious mixed-mode product development cycle; microstrip inductors; particle-beam stand; proton-beam treatment; proton-enhanced inductors; proton-enhanced microstrip inductors; Conductivity; Frequency; Inductance; Inductors; Isolation technology; Microstrip; Protons; Resonance; Silicon; Spirals;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Technology Workshop, 2002
  • Print_ISBN
    0-7803-7604-8
  • Type

    conf

  • DOI
    10.1109/SMTW.2002.1197414
  • Filename
    1197414