Title :
Synthesis of SiC using ion beam and PECVD
Author :
Yang, Liun ; Chen, Changqing ; Ren, Congxin ; Yan, Jinlong ; Chen, Xueliang
Author_Institution :
Inst. of Metall., Acad. Sinica, Shanghai, China
Abstract :
SiC films were synthesized by ion implantation, ion beam enhanced deposition, reactive ion beam sputtering and plasma enhanced chemical vapor deposition (PECVD). P-type (100) Si was implanted with 60 keV C + at different temperatures to form a SiC buried layer. Implanting at 680°C, there are two apparent XRD peaks due to the β-SiC(200) and (400) reflections in as implanted samples. Ion beam enhanced deposition could be adopt to prepare amorphous SiC films containing SiC bonds whose absorption bands located at 800 cm-1 . Hydrogenated amorphous SiC films were synthesized by reactive ion beam sputtering deposition. Meanwhile, hydrogenate amorphous SiC film which can exhibit green photoluminescence at room temperature were prepared by PECVD
Keywords :
amorphous semiconductors; bonds (chemical); buried layers; hydrogen; ion beam assisted deposition; ion implantation; noncrystalline structure; photoluminescence; plasma CVD; semiconductor growth; semiconductor thin films; silicon compounds; sputter deposition; wide band gap semiconductors; β-SiC; 20 C; 680 C; 800 cm-1; P-type (100) Si; PECVD; SiC; SiC bonds; SiC buried layer; SiC:H; XRD peaks; amorphous SiC films; green photoluminescence; hydrogenated amorphous SiC films; ion beam enhanced deposition; ion implantation; plasma enhanced chemical vapor deposition; reactive ion beam sputtering; room temperature; synthesis; Amorphous materials; Chemical vapor deposition; Ion beams; Ion implantation; Optical films; Plasma chemistry; Plasma immersion ion implantation; Plasma temperature; Silicon carbide; Sputtering;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4306-9
DOI :
10.1109/ICSICT.1998.786161