DocumentCode
3432274
Title
Optimisation of integrated RF varactors on a 0.35 μm BiCMOS technology
Author
Kelly, Sean C. ; Power, James A. ; O´Neill, Mike
Author_Institution
Analog Devices, Limerick, Ireland
fYear
2003
fDate
17-20 March 2003
Firstpage
113
Lastpage
117
Abstract
Integrated varactors are becoming a common feature for many RF designs and in particular RF voltage controlled oscillators (VCOs). Optimisation of the quality of both the inductor and the varactor from the VCO core is essential. This work details the characterisation and optimisation of a number of varactor types available on a typical sub-micron BiCMOS process. Engineering of the bottom plate of the varactor was used to optimise the quality factor of the varactor. No additional mask layers or processing steps were required to achieve this. Integrated isolated diode varactors with quality factors of 30 at 2 GHz have been demonstrated with tuning capacitance ranges of 2.5. Integrated MOS capacitor varactors with quality factors of 50 at 2 GHz have been demonstrated with tuning capacitance range of 5.
Keywords
BiCMOS analogue integrated circuits; Q-factor; capacitance; masks; radiofrequency integrated circuits; varactors; voltage-controlled oscillators; 0.35 micron; 2 GHz; BiCMOS technology; bottom plate; integrated RF varactors; isolated diode varactors; mask layers; processing steps; quality factor; sub-micron process; tuning capacitance ranges; voltage controlled oscillators; BiCMOS integrated circuits; Capacitance; Diodes; Inductors; MOS capacitors; Q factor; Radio frequency; Tuning; Varactors; Voltage-controlled oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 2003. International Conference on
Print_ISBN
0-7803-7653-6
Type
conf
DOI
10.1109/ICMTS.2003.1197426
Filename
1197426
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