• DocumentCode
    3432592
  • Title

    Deep Submicron Technology: Opportunity or Dead End for Dynamic Circuit Techniques

  • Author

    Cornelius, Claas ; Grassert, Frank ; Köppe, Siegmar ; Timmermann, Dirk

  • Author_Institution
    Inst. of Appl. Microelectron. & Comput. Eng., Rostock Univ.
  • fYear
    2007
  • fDate
    Jan. 2007
  • Firstpage
    330
  • Lastpage
    338
  • Abstract
    Dynamic circuit techniques offer potential advantages over static CMOS, especially if more complex logic is to be implemented. Therefore, they are extensively used in high performance designs to speed up critical subsystems. However, the speed benefit is traded off for increased power consumption, area overhead, design effort, and reduced noise margins. The continuing process of technology scaling raises further concerns of reliability and limits the wide use of dynamic logic. This paper presents evaluations in terms of area, power dissipation, and propagation delay for several dynamic logic styles as well as for static CMOS in a 90 nm technology. The intention is to assess if dynamic circuit techniques are still an option to boost performance against the background of the issues of nanotechnology. Moreover, issues of reliability and signal integrity, gained from practical experience for different testbenches, and possible solutions are discussed. Finally, an automated design flow for dynamic logic, derived from a standard CMOS flow, is presented
  • Keywords
    CMOS logic circuits; 90 nm; automated design flow; deep submicron technology; dynamic circuit techniques; dynamic logic styles; power dissipation; propagation delay; reliability; signal integrity; static CMOS; CMOS logic circuits; CMOS technology; Circuit noise; Circuit testing; Energy consumption; Logic design; Nanotechnology; Noise reduction; Power dissipation; Propagation delay;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2007. Held jointly with 6th International Conference on Embedded Systems., 20th International Conference on
  • Conference_Location
    Bangalore
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-2762-0
  • Type

    conf

  • DOI
    10.1109/VLSID.2007.59
  • Filename
    4092067