• DocumentCode
    3432742
  • Title

    Applied linear programming model to optimize resist arrangement

  • Author

    Bernie-Lo ; Chiu, Andy

  • fYear
    2002
  • fDate
    10-11 Dec. 2002
  • Firstpage
    289
  • Lastpage
    293
  • Abstract
    Photolithography holds the bottleneck of productivity and carries the role of supplier in semiconductor industry, which is considered to be the most popular industry among other high-tech industries nowadays in the world. Therefore, photolithography procedure should be the most critical manufacturing process in semiconductor industry. To maximize productivities by using existing steppers is the goal for all the semiconductor manufactories, since the stepper is the key and most expensive equipment in the photolithography process. Therefore, how to improve and balance the stepper capacity is one of the major missions for us. However, the resist is the major key point of what layers stepper can run, so how to arrange the resist distribution into steppers decides whether the loading of each stepper is balanced or not. This study focused on the resist distribution system, and tried to develop an optimal system by referring to some important references. We treated linear programming as the basic model to achieve optimization for resist distribution. This model can exactly compute the quantity of resists that were used; meanwhile, it can accurately predict the amount deviated by the change of wafer start plan. From experience and statistics, the model fit the field data quite well.
  • Keywords
    capacity planning (manufacturing); linear programming; photolithography; production control; resists; semiconductor device manufacture; bottleneck; existing steppers; linear programming model; optimize resist arrangement; photolithography; resist distribution system; semiconductor industry; stepper capacity; wafer start plan; Electronics industry; Linear programming; Lithography; Manufacturing industries; Manufacturing processes; Predictive models; Productivity; Resists; Semiconductor device modeling; Statistical distributions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Technology Workshop, 2002
  • Print_ISBN
    0-7803-7604-8
  • Type

    conf

  • DOI
    10.1109/SMTW.2002.1197450
  • Filename
    1197450