DocumentCode :
3432777
Title :
Controllability-driven Power Virus Generation for Digital Circuits
Author :
Najeeb, K. ; Gururaj, Karthik ; Kamakoti, V. ; Vedula, Vivekanand M.
Author_Institution :
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol. Madras, Chennai
fYear :
2007
fDate :
6-10 Jan. 2007
Firstpage :
407
Lastpage :
412
Abstract :
The problem of peak power estimation in CMOS circuits is essential for analyzing the reliability and performance of circuits at extreme conditions. The power virus problem involves finding input vectors that cause maximum dynamic power dissipation (maximum toggles) in circuits. In this paper, an approach for power virus generation for both combinational and sequential circuits is presented. The basic intuition behind the approach is to use the 0- and 1- controllability measures of the gate outputs in the circuit to guide the D-algorithm. The proposed technique was employed on the ISCAS´85 and ISCAS´89 circuits. The results of the above show a significant increase in power dissipation when compared to the best known existing techniques reported in the literature
Keywords :
CMOS logic circuits; automatic test pattern generation; combinational circuits; sequential circuits; CMOS circuits; D-algorithm; automatic test pattern generation; combinational circuits; controllability-driven power virus generation; digital circuits; fanout free regions; maximum dynamic power dissipation; maximum toggles; peak power estimation; sequential circuits; Capacitance; Circuit testing; Clocks; Digital circuits; Power dissipation; Power engineering and energy; Power generation; Power system reliability; Reliability engineering; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2007. Held jointly with 6th International Conference on Embedded Systems., 20th International Conference on
Conference_Location :
Bangalore
ISSN :
1063-9667
Print_ISBN :
0-7695-2762-0
Type :
conf
DOI :
10.1109/VLSID.2007.55
Filename :
4092078
Link To Document :
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