• DocumentCode
    3432945
  • Title

    Outage Analysis of a University Campus Network

  • Author

    Choi, Baek-Young ; Song, Sejun ; Koffler, George ; Medhi, Deep

  • Author_Institution
    Missouri Univ., Kansas City
  • fYear
    2007
  • fDate
    13-16 Aug. 2007
  • Firstpage
    675
  • Lastpage
    680
  • Abstract
    Understanding outage and failure characteristics of a network is important to assess the availability of the network, determine failure source for trouble-shooting, and identify weak areas for network availability improvement. However, there has been virtually no failure measurement and analysis on access networks. In this paper, we carry out an in-depth outage and failure analysis of a university campus network using a rich set of both node outage and link failure data. We investigate the aspects of spatial and temporal localities of failures and outages, the relation of link failure and node outage, and the impact of the hierarchical and redundant network design on outage. We find most of link failure events are not caused by node failures; frequent link up-down events may not lead to the corresponding node´s outage; for access layer switches that connect to end hosts, their link up-down events exhibit periodic patterns.
  • Keywords
    IP networks; telecommunication links; telecommunication network reliability; access networks; failure source; link failure; link failure events; network availability improvement; network failure characteristics; network outage characteristics; node outage; outage analysis; redundant network design; trouble-shooting; university campus network; Automation; Availability; Cities and towns; Computer network reliability; Failure analysis; Fault tolerant systems; Filtering; Hardware; Spine; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Communications and Networks, 2007. ICCCN 2007. Proceedings of 16th International Conference on
  • Conference_Location
    Honolulu, HI
  • ISSN
    1095-2055
  • Print_ISBN
    978-1-4244-1251-8
  • Electronic_ISBN
    1095-2055
  • Type

    conf

  • DOI
    10.1109/ICCCN.2007.4317895
  • Filename
    4317895