DocumentCode :
3432947
Title :
Model Based Test Generation for Microprocessor Architecture Validation
Author :
Kodakara, S.V. ; Mathaikutty, Deepak A. ; Dingankar, Ajit ; Shukla, Sandeep ; Lilja, David
Author_Institution :
Minnesota Univ., Minneapolis, MN
fYear :
2007
fDate :
Jan. 2007
Firstpage :
465
Lastpage :
472
Abstract :
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used in simulation based validation, like simulators and test generators, to validate the system, architecture, microcode, and RTL abstractions of the processor, were manually derived from the specification document. The incomplete informal specification document along with manual translation introduces inconsistency and bugs in the validation collaterals, resulting in increased cost and time to validate the processor. We envision a novel metamodeling based microprocessor modeling and validation environment (MMV) to address this problem. MMV provides a language independent modeling environment to describe the processor at various abstraction levels, a refinement flow to consistently move from one abstraction to the next lower abstraction and code generators to automatically generate the validation collaterals from the models. As a first step towards our vision, in this paper, we describe architectural modeling in MMV and automatic generation of random and coverage directed test suites from the models. We demonstrate the practicality of our approach for validating real world instruction set architectures (ISA) by modeling and generating test cases for eight complex instructions from Intel1 reg virtualization technology
Keywords :
automatic test pattern generation; formal verification; instruction sets; microprocessor chips; Intel1 virtualization technology; architectural modeling; automatic test generation; code generators; coverage directed test; functional validation; instruction set architectures; language independent modeling environment; metamodeling; microprocessor architecture validation; microprocessor modeling and validation environment; model based test generation; refinement flow; simulation based validation; specification document; validation collaterals; Analytical models; Computer bugs; Cost function; Microprocessors; Natural languages; Product development; Testing; Time to market; Trademarks; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2007. Held jointly with 6th International Conference on Embedded Systems., 20th International Conference on
Conference_Location :
Bangalore
ISSN :
1063-9667
Print_ISBN :
0-7695-2762-0
Type :
conf
DOI :
10.1109/VLSID.2007.108
Filename :
4092087
Link To Document :
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