DocumentCode :
3433181
Title :
IEC 801-4 - EFT transients
Author :
Lutz, M.
Author_Institution :
Haefely, Inc.
fYear :
1994
fDate :
1994
Keywords :
Circuit testing; Electromagnetic compatibility; Equivalent circuits; IEC standards; Immunity testing; Interference; Shape; Sparks; Switches; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SCV EMC '94, IEEE
Type :
conf
DOI :
10.1109/SCVEMC.1994.675326
Filename :
675326
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3433181
