Title :
A CMOS amplitude detector for RF-BIST and calibration
Author :
Sleiman, S.B. ; Ismail, Mohammedm
Author_Institution :
Analog VLSI Lab., Ohio State Univ., Columbus, OH, USA
Abstract :
In this work, we present a wideband CMOS RF amplitude detector for on-chip self-test and calibration. The proposed detector offers a high conversion gain (-10V/V), thus allowing for very fine detection of RF amplitude changes, and has a wide dynamic range enabling detection of RF peak amplitude changes between 0 and 0.7V. Additionally, its wideband capabilities make it especially useful for today´s multiband multi-standard applications such as WLAN and WiMAX. The detector is built in 0.18¿m CMOS and uses a 1.8V power supply.
Keywords :
CMOS digital integrated circuits; built-in self test; calibration; detector circuits; CMOS amplitude detector; RF-BIST; calibration; on-chip self-test; size 0.18 mum; voltage 1.8 V; Built-in self-test; Calibration; Circuit testing; Detectors; Dynamic range; Feature extraction; Radio frequency; USA Councils; Very large scale integration; Wideband; Amplitude detector; CMOS radio frequency (RF) circuits; built-in self-test (BIST);
Conference_Titel :
Electronics, Circuits, and Systems, 2009. ICECS 2009. 16th IEEE International Conference on
Conference_Location :
Yasmine Hammamet
Print_ISBN :
978-1-4244-5090-9
Electronic_ISBN :
978-1-4244-5091-6
DOI :
10.1109/ICECS.2009.5410778
