DocumentCode :
3434101
Title :
Correlation between upper and lower noise sidebands
Author :
Walls, F.L.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear :
1998
fDate :
27-29 May 1998
Firstpage :
199
Lastpage :
203
Abstract :
Experimental measurements, supported by a simple model, are used to show that the upper and lower phase modulation (PM) noise sidebands are always equal and 100% correlated, independent of whether the noise power originates from multiplicative or additive processes. Similarly we show that the upper and lower amplitude modulation (AM) noise sidebands are also equal and 100% correlated, independent of whether the noise power originates from multiplicative or additive processes. Moreover the single sideband AM (PM) noise is always equal to ½ the total AM (PM) noise. Although the upper and lower PM (AM) noise sidebands are equal and correlated for broadband additive noise, the phase between the AM and the PM sidebands varies randomly with time. These conclusions still hold even when the RF noise sidebands are not symmetric about the carrier
Keywords :
amplitude modulation; electric noise measurement; phase modulation; phase noise; AM noise; PM noise; RF noise sidebands; additive processes; broadband additive noise; multiplicative processes; noise power; noise sidebands; phase modulation; single sideband noise; symmetricity; Additive noise; Detectors; Noise figure; Noise generators; Noise measurement; Phase detection; Phase measurement; Phase modulation; Phase noise; Spectral analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1998. Proceedings of the 1998 IEEE International
Conference_Location :
Pasadena, CA
ISSN :
1075-6787
Print_ISBN :
0-7803-4373-5
Type :
conf
DOI :
10.1109/FREQ.1998.717905
Filename :
717905
Link To Document :
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