DocumentCode :
3434114
Title :
Calibration Based Methods for Substrate Modeling and Noise Analysis for Mixed-Signal SoCsc
Author :
Debnath, Sankar P. ; Kumar, Ganesh P. ; Jairam, S.
Author_Institution :
WSG Texas Instrum., Bangalore
fYear :
2007
fDate :
6-10 Jan. 2007
Firstpage :
887
Lastpage :
892
Abstract :
A novel and an extremely fast substrate model creation and noise analysis methodology is presented. The method takes a prototype floorplan or layout as an input and outputs a detailed 2-D plot of the noise voltage distribution at the surface. Estimated noise injection is attached to a substrate model to compute noise distribution across the die. An adaptive finite element based extraction method is described for modeling. The model is then calibrated to an extracted substrate model based on various parameters like surface and bulk resistivity. The method is optimized for both accuracy and speed. It is also shown how a designer can perform various what-if analysis with this flow in both pre-layout and post-layout phases. Grounding schemes and isolation structures are then discussed with various what-if analysis. Finally simulation data and results from an actual design are shown where this methodology has been applied.
Keywords :
calibration; finite element analysis; mixed analogue-digital integrated circuits; system-on-chip; adaptive finite element-based extraction method; bulk resistivity; calibration based methods; extremely fast substrate model creation; grounding schemes; isolation structures; mixed-signal SoC; noise analysis; noise voltage distribution; substrate modeling; what-if analysis; Calibration; Circuit noise; Costs; Coupling circuits; Degradation; Doping profiles; Finite difference methods; Instruments; Packaging; Semiconductor process modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2007. Held jointly with 6th International Conference on Embedded Systems., 20th International Conference on
Conference_Location :
Bangalore
ISSN :
1063-9667
Print_ISBN :
0-7695-2762-0
Type :
conf
DOI :
10.1109/VLSID.2007.48
Filename :
4092153
Link To Document :
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