• DocumentCode
    3434181
  • Title

    Active silicon substrate technology for miniaturized ultra high performance processing

  • Author

    Malek, Homayoun ; Pearson, Richard

  • Author_Institution
    Lockheed Missiles & Space Co. Inc., Palo Alto, CA, USA
  • fYear
    1993
  • fDate
    1993
  • Firstpage
    346
  • Lastpage
    357
  • Abstract
    A multichip module (MCM) technology called active silicon substrate (ASIS) that raises architectural design of signal/data processing systems to much higher levels of microminiaturization and performance is described. The merits of active substrates over the conventional passive ones are demonstrated through the implementation of several features that are possible when active elements are embedded in the interconnecting substrate and mounting platform. These include scalable fault-tolerant computing elements, replaceable drivers/buffers, and embedded local/global self-test circuits. The ASIS technology allows more than one type of processing architecture to be embedded and integrated in the same substrate, thus providing a viable approach for water scale integration.
  • Keywords
    VLSI; digital integrated circuits; hybrid integrated circuits; integrated circuit technology; multichip modules; silicon; substrates; ASIS technology; MCM; WSI; active Si substrate technology; embedded local/global self-test circuits; interconnecting substrate; miniaturized ultra high performance processing; mounting platform; multichip module; packaging; processing architecture; replaceable drivers/buffers; scalable fault-tolerant computing elements; water scale integration; Built-in self-test; Data processing; Driver circuits; Embedded computing; Fault tolerance; Integrated circuit interconnections; Multichip modules; Signal design; Signal processing; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Scale Integration, 1993. Proceedings., Fifth Annual IEEE International Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-0867-0
  • Type

    conf

  • DOI
    10.1109/ICWSI.1993.255243
  • Filename
    255243