DocumentCode
3434181
Title
Active silicon substrate technology for miniaturized ultra high performance processing
Author
Malek, Homayoun ; Pearson, Richard
Author_Institution
Lockheed Missiles & Space Co. Inc., Palo Alto, CA, USA
fYear
1993
fDate
1993
Firstpage
346
Lastpage
357
Abstract
A multichip module (MCM) technology called active silicon substrate (ASIS) that raises architectural design of signal/data processing systems to much higher levels of microminiaturization and performance is described. The merits of active substrates over the conventional passive ones are demonstrated through the implementation of several features that are possible when active elements are embedded in the interconnecting substrate and mounting platform. These include scalable fault-tolerant computing elements, replaceable drivers/buffers, and embedded local/global self-test circuits. The ASIS technology allows more than one type of processing architecture to be embedded and integrated in the same substrate, thus providing a viable approach for water scale integration.
Keywords
VLSI; digital integrated circuits; hybrid integrated circuits; integrated circuit technology; multichip modules; silicon; substrates; ASIS technology; MCM; WSI; active Si substrate technology; embedded local/global self-test circuits; interconnecting substrate; miniaturized ultra high performance processing; mounting platform; multichip module; packaging; processing architecture; replaceable drivers/buffers; scalable fault-tolerant computing elements; water scale integration; Built-in self-test; Data processing; Driver circuits; Embedded computing; Fault tolerance; Integrated circuit interconnections; Multichip modules; Signal design; Signal processing; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Wafer Scale Integration, 1993. Proceedings., Fifth Annual IEEE International Conference on
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-0867-0
Type
conf
DOI
10.1109/ICWSI.1993.255243
Filename
255243
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