Title :
A robust parameter extraction method for diode with series resistance
Author :
Wong, Hei ; Lam, W.H.
Author_Institution :
Dept. of Electron. Eng., City Univ., Kowloon, China
Abstract :
This work reports a novel model parameter extraction method for diodes with the presence of series resistance. Using the proportional difference of applied voltages and the least square line method, the ideality factor and series resistance can be determined uniquely. Several different kinds of diodes from signal detector to power diode are used in the testing. Results show that the proposed method is simple, robust and accurate
Keywords :
electric resistance; power semiconductor diodes; semiconductor device measurement; semiconductor device models; semiconductor diodes; diode; diode testing; ideality factor; least square line method; model parameter extraction method; power diode; proportional applied voltage difference; robust parameter extraction method; series resistance; signal detector diode; Breakdown voltage; Calibration; Cities and towns; Electrical resistance measurement; Equations; Least squares methods; Parameter extraction; Robustness; SPICE; Semiconductor diodes;
Conference_Titel :
Electron Devices Meeting, 2001. Proceedings. 2001 IEEE Hong Kong
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-6714-6
DOI :
10.1109/HKEDM.2001.946913
