Title :
A chemical sensor based on the measurement of differential phase related to surface plasmon resonance
Author :
Ho, H.P. ; Lam, W.W. ; Wu, S.Y. ; Yang, M.
Author_Institution :
Dept. of Phys. & Mater. Sci., City Univ. of Hong Kong, Kowloon, China
Abstract :
The optical phase change associated with the surface plasmon resonance (SPR) effect that exists in a glass-metal-dielectric stack has been studied using a differential phase imaging technique. A typical prism-coupled SPR set-up was constructed and a Mach-Zehnder interferometer was used to perform interferometric analysis between the two orthogonal polarizations in the exit beam. By stepping the phase of the reference arm, one can measure the phase change caused by the SPR effect. Since the reference and signal beams traverse identical optical paths, we expect that this scheme can be more robust in terms of noise immunity. The interrogation area can be enlarged to enable imaging of the SPR sensing surface. Initial phase measurements obtained from a salt-water mixture are presented to demonstrate the operation of the technique
Keywords :
Mach-Zehnder interferometers; chemical sensors; light polarisation; optical noise; optical sensors; phase measurement; surface plasmon resonance; Mach-Zehnder interferometer; SPR effect; SPR sensing surface imaging; chemical sensor; differential phase imaging technique; differential phase measurement; exit beam orthogonal polarizations; glass-metal-dielectric stack; interferometric analysis; interrogation area; noise immunity; optical paths; optical phase change; phase change; phase measurements; prism-coupled SPR set-up; reference arm phse stepping; reference beam; salt-water mixture; signal beam; surface plasmon resonance; surface plasmon resonance effect; Chemical sensors; Optical beams; Optical imaging; Optical interferometry; Optical noise; Optical sensors; Performance analysis; Phase measurement; Plasmons; Resonance;
Conference_Titel :
Electron Devices Meeting, 2001. Proceedings. 2001 IEEE Hong Kong
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-6714-6
DOI :
10.1109/HKEDM.2001.946917