DocumentCode
3434431
Title
Characterization of immobilized DNA probes on the surface of silicon compatible materials
Author
Wen, Xu ; Mei, Xue ; Lenigk, Ralf ; Carles, Maria ; Sucher, NIkolaus J. ; Ip, Nancy Y. ; Chan, Mansun
Author_Institution
Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., China
fYear
2001
fDate
2001
Firstpage
60
Lastpage
63
Abstract
In this paper, the objectives and methodologies of deoxyribonucleic acid (DNA) analysis based on micro arrays produced by microelectronic fabrication technology is reviewed. The important issue of material compatibility between DNA material and silicon based material is addressed. With a special surface treatment, DNA probes have been successfully attached (or immobilized) on the surface of silicon compatible materials (mainly silicon dioxide). Through the use of optical labels that emit optical fluorescence under the illumination of a UV light source, the number of DNA probes immobilized on the silicon dioxide surface can be quantified. The results are further analyzed with atomic force microscopy to visualize the surface conditions. The successful immobilization of DNA probes on silicon wafers is very important for the fabrication of DNA chips for DNA analysis
Keywords
DNA; atomic force microscopy; biological techniques; biosensors; chemical sensors; electric sensing devices; fluorescence; probes; surface treatment; ultraviolet radiation effects; DNA analysis; DNA chip fabrication; DNA material; DNA probe attachment; DNA probe immobilization; DNA probes; Si; SiO2; UV light source illumination; atomic force microscopy; deoxyribonucleic acid; immobilized DNA probes; material compatibility; micro arrays; microelectronic fabrication technology; optical fluorescence; optical labels; silicon based material; silicon compatible material surface; silicon compatible materials; silicon dioxide surface; silicon wafers; surface conditions; surface treatment; Atom optics; Atomic force microscopy; DNA; Microelectronics; Optical device fabrication; Optical materials; Probes; Silicon compounds; Stimulated emission; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2001. Proceedings. 2001 IEEE Hong Kong
Conference_Location
Hong Kong
Print_ISBN
0-7803-6714-6
Type
conf
DOI
10.1109/HKEDM.2001.946918
Filename
946918
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