• DocumentCode
    3434431
  • Title

    Characterization of immobilized DNA probes on the surface of silicon compatible materials

  • Author

    Wen, Xu ; Mei, Xue ; Lenigk, Ralf ; Carles, Maria ; Sucher, NIkolaus J. ; Ip, Nancy Y. ; Chan, Mansun

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., China
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    60
  • Lastpage
    63
  • Abstract
    In this paper, the objectives and methodologies of deoxyribonucleic acid (DNA) analysis based on micro arrays produced by microelectronic fabrication technology is reviewed. The important issue of material compatibility between DNA material and silicon based material is addressed. With a special surface treatment, DNA probes have been successfully attached (or immobilized) on the surface of silicon compatible materials (mainly silicon dioxide). Through the use of optical labels that emit optical fluorescence under the illumination of a UV light source, the number of DNA probes immobilized on the silicon dioxide surface can be quantified. The results are further analyzed with atomic force microscopy to visualize the surface conditions. The successful immobilization of DNA probes on silicon wafers is very important for the fabrication of DNA chips for DNA analysis
  • Keywords
    DNA; atomic force microscopy; biological techniques; biosensors; chemical sensors; electric sensing devices; fluorescence; probes; surface treatment; ultraviolet radiation effects; DNA analysis; DNA chip fabrication; DNA material; DNA probe attachment; DNA probe immobilization; DNA probes; Si; SiO2; UV light source illumination; atomic force microscopy; deoxyribonucleic acid; immobilized DNA probes; material compatibility; micro arrays; microelectronic fabrication technology; optical fluorescence; optical labels; silicon based material; silicon compatible material surface; silicon compatible materials; silicon dioxide surface; silicon wafers; surface conditions; surface treatment; Atom optics; Atomic force microscopy; DNA; Microelectronics; Optical device fabrication; Optical materials; Probes; Silicon compounds; Stimulated emission; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2001. Proceedings. 2001 IEEE Hong Kong
  • Conference_Location
    Hong Kong
  • Print_ISBN
    0-7803-6714-6
  • Type

    conf

  • DOI
    10.1109/HKEDM.2001.946918
  • Filename
    946918